Infrared Thickness Meter

RX-200 (Film / Coating thickness)

RX-200

RX-200

Structure of Liquid Crystal

For determining optical film and various plastic films (PET, PP, PE, PI, PVA, etc.)
Standard online instrument using regular reflection p-polarization method.
Allows highly accurate measurement even for transparent products and ultra-thin films.

Features

Allows selective measurement

Allows selective measurement such as measurement of intermediate layers, sole coating layers, etc.

High response speed and long-term stability

High speed measurement with approximately 50 msec minimum response speed is possible. Ensures long-term accuracy against changes in the ambient environment and instrument fluctuation by using three wavelength photometry.

Target products

Various kinds of films such as PP, PE, PET, PI

Measurement range: 0.1-1000 μm

Measurement accuracy: 0.1 μm

(Depending on the material. For details, contact us.)

Specifications

Measurement specifications
Photometric type Infrared absorption spectroscopy
Spectroscopy Rotating filter(Six filters can be mounted.)
Measuring distance 25mm (from the lower surface of the main unit)
Measurement area 5 × 8 mm (oval)
Main unit specifications
Sensor head Outer dimensions: 230(W)×134(D)×90(H) (excluding protruding parts)
Weight: 3.3kg
Relay unit Outer dimensions: 250(W)×140(D)×113(H) (excluding protruding parts)
Weight: 3kg
Power supply: 100~240VAC 50/60Hz 200VA
Data processing unit Outside dimensions: 275(W)×300(D)×165(H) (excluding protruding parts)
Weight: 6kg
Power supply: 100~240VAC 50/60Hz 200VA
External output Selectable from Analog 0 – 10V or 4-20mA (preset before shipment)
Operating temperature 5 – 40 deg. C (No dew condensation. Air purge is an essential condition under ambient conditions of 35 deg. C.)